2011-13-0478
Click on image to view high resolution
2011-13-0478
Click on image to view high resolution

Opus Series 300

Scanning Probe Microscope

In-house design

Edwin Hwu, Oscar Chang, Taiwan

Design

KAMIA (Herman Liang, Yujen Lin), Taiwan

Red Dot
Opus Series 300 scanning probe microscopes employ a novel astigmatic detection method for the imaging of materials down to a resolution of 2 nm. As pioneers in the field of nano-technology research, these devices allow researchers and technicians to conduct even complex materials characterisation experiments with ease. The multi-step process required for setting up a scan has been simplified, making calibrating, loading and positioning the microscope intuitive. The device has a sealed chamber in which the sample is placed, thus reducing environmental disturbances which could produce noise in the imaging signal. The compact microscope displays a clean rectangular form with a base surface of 145 x 155 mm and a height of 188 mm when closed, and 268 mm when the chamber is opened. It includes an Ethernet interface for data transmission.